Иллюстрированный самоучитель по введению в экспертные системы


Retrieval time from semantic memory.

(1969). Retrieval time from semantic memory. Journal of Verbal Learning and Verbal Behavior, 8, p. 240-247.

Coombs M. J., eds. (1984). Developments in Expert Systems. London: Academic Press.

Cooper G. F. (1990). The computational complexity of probabilistic inference using Bavesian belief networks. Artificial Intelligence, 42, p. 393-405.

Corkill D. D. (1991). Blackboard systems. Al Expert, 6(9), p. 40-47. Coyne R, (1988). Logic Models of Design. London: Pitman.

Cox R. (1946). Probability frequency and reasonable expectation. American Journal of Physics, 14(1), p. 1-13.

Craig I. (1995). Blackboard Systems. Norwood, NJ: Ablex.

Davies J. and May R. (1995). The development of a prototype "correctly dressed" case-based reasoner: Efficacy of CBR-Express. In Progress in Case-Based Reasoning (Watson I., eds.). Lecture Notes in Artificial Intelligence, 1020. Berlin: Springer-Verlag.

Davis R. (1980, a). Meta-rules: reasoning about control. Artificial Intelligence, 15, p. 179-222.

Davis R. (1980, b). Applications of meta-level knowledge to the construction, maintenance and use of large knowledge bases. In Knowledge-Based Systems in Artificial Intelligence (Davis R. and Lenat D., eds.) p. 229-490. New York: McGraw-Hill.

Davis R. (1982). Expert systems: Where are we? And where do we go from here? Al Magazine, 3(2).

Davis R. (1984). Diagnostic reasoning based on structure and behavior. Artificial Intelligence, , 24, p. 347-410.

Davis R. (1989). Expert systems: how far can they go? Part Two. Al Magazine, 10(2), Summer 1989, p. 65-77.

Davis R. and King J. (1977). An overview of production systems. In Machine Intelligence 8 (Elcock E. W. and Michie D., eds.), p. 300-332. New York: Wiley.

Davis R. and Lenat D. (1980). Knowledge-Based Systems in Artificial Intelligence. New York: McGraw-Hill.

De Kleer J. (1986). An assumption based TMS. Artificial Intelligence, 28, p. 127-162.

De Kleer J. and Williams В. С. (1987). Diagnosing multiple faults. Artificial Intelligence, 32, p. 97-130.

Содержание  Назад  Вперед